• DocumentCode
    82587
  • Title

    Thick High J_math\\rm{c} YBCO Films on ABAD-YSZ Templates

  • Author

    Pahlke, Patrick ; Hering, Michael ; Sieger, Max ; Lao, Mayraluna ; Eisterer, Michael ; Usoskin, Alexander ; Stromer, Jan ; Holzapfel, Bernhard ; Schultz, Ludwig ; Huhne, Ruben

  • Author_Institution
    IFW Dresden, Dresden, Germany
  • Volume
    25
  • Issue
    3
  • fYear
    2015
  • fDate
    Jun-15
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, we report on high critical current density (Jc) YBCO films deposited by pulsed laser deposition on CeO2 buffered ABAD-YSZ/stainless steel templates with a thickness ranging from 0.7 μm up to 4.2 μm. In the thinnest sample, a transition temperature (Tc) of 90 K and a critical current density of 2.6 MA/cm2 was reached at 77 K. With increasing thickness, Tc drops as well as Jc. The total critical current (Ic) increases strongly up to a thickness of 2.8 μm, reaching a value of almost 600 A/cm-width. In thicker films, no further increase in Ic was observed. A higher surface roughness and misoriented YBCO grains were found in layer thicknesses above 2.8 μm and are assumed to be the main reason for the limitation of the current transport.
  • Keywords
    barium compounds; critical current density (superconductivity); high-temperature superconductors; ion beam assisted deposition; pulsed laser deposition; superconducting thin films; superconducting transition temperature; surface roughness; yttrium compounds; ABAD-YSZ templates; YBCO; critical current density; current transport; high Jc YBCO films; pulsed laser deposition; size 0.7 mum to 4.2 mum; surface roughness; transition temperature; Conductors; Critical current density (superconductivity); Films; Integrated circuits; Pulsed laser deposition; Temperature measurement; Yttrium barium copper oxide; Coated conductors; PLD; YBCO; high-temperature superconductors; thick films;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2014.2378533
  • Filename
    6979217