DocumentCode
825949
Title
The Behaviour of HgI2 Nuclear Detectors Irradiated with High X-Ray Fluences
Author
Schieber, Marc ; Beinglass, I. ; Holzer, Adrian ; Dishon, G.
Author_Institution
School of Applied Science, Hebrew University of Jerusalem, Israel E. Loewenthal Institute of Radium, Hadassah University Hosp. Jerusalem, Israel
Volume
24
Issue
1
fYear
1977
Firstpage
148
Lastpage
153
Abstract
Nuclear detectors of HgI2 exposed to high fluences of up to 40 keV x-rays of counting rates up to 1012 photons sec-1 cm-2 which correspond to about 400 R/min show linear dependence of the dc current of the detector with the x-ray dose. Polarization can cause the deterioration of the dc current within the detector with a decay time which varies from several seconds to several hours at the highest fluence after which the dc current reaches a steady value. Better crystals, however, show practically no time deterioration of the dc current. The dc response of HgI2 nuclear detectors to high fluences of x-ray pulses of several milliseconds duration was also measured. Both the rise times and decay times varied between 0.4 to 0.8 millisecond for uncollimated and 0.06 to 0.3 millisecond for collimated x-rays.
Keywords
Collimators; Crystals; Furnaces; Gamma ray detection; Gamma ray detectors; Nuclear measurements; Pulse measurements; Radiation detectors; X-ray detection; X-ray detectors;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1977.4328658
Filename
4328658
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