DocumentCode :
826055
Title :
Process analysis and abnormal situation detection: from theory to practice
Author :
Kourti, T.
Author_Institution :
Dept. of Chem. Eng., McMaster Univ., Hamilton, Ont.
Volume :
22
Issue :
5
fYear :
2002
fDate :
10/1/2002 12:00:00 AM
Firstpage :
10
Lastpage :
25
Abstract :
The article discusses the use of latent variable models based on historical data and examines their potential and limitations for improving operations for both batch and continuous processes. The use of these models for multivariate statistical process monitoring, abnormal situation detection, and fault diagnosis is demonstrated. Examples from state-of-the-art major industrial applications currently running online illustrate the tremendous potential of these methods. In this context, an industrial application for abnormal situation detection is defined as "state of the art" if it has been operational several years after it was commissioned, has generated large savings, has been operating safely and/or has improved safety conditions in the plant, and is accepted enthusiastically by the operators. Such an application could be based entirely on known theory, but frequently it includes company proprietary modifications to suit the particular operating characteristics of the process. The article contains an extensive literature review on the subject and practical considerations for the user, as well as warnings about potential pitfalls in areas ranging from data acquisition to modeling to online application.
Keywords :
data mining; fault diagnosis; least squares approximations; matrix algebra; principal component analysis; process monitoring; quality control; statistical process control; abnormal situation detection; batch and processes; continuous processes; fault diagnosis; historical data; latent variable models; multivariate statistical process monitoring; process analysis; Control charts; Data acquisition; Databases; Fault detection; Fault diagnosis; Monitoring; Principal component analysis; Production; Safety; Signal to noise ratio;
fLanguage :
English
Journal_Title :
Control Systems, IEEE
Publisher :
ieee
ISSN :
1066-033X
Type :
jour
DOI :
10.1109/MCS.2002.1035214
Filename :
1035214
Link To Document :
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