• DocumentCode
    826265
  • Title

    Laser diode burn-in and reliability testing

  • Author

    Johnson, Lawrence A.

  • Volume
    44
  • Issue
    2
  • fYear
    2006
  • Firstpage
    4
  • Lastpage
    7
  • Abstract
    More than 99 percent of all lasers manufactured in the world today are semiconductor laser diodes. Reliability is a concern in every laser diode application, whether it is a simple $10 laser pointer or a space-qualified optical transmitter link. The commercial success of a laser supplier rests largely on his ability to develop a robust manufacturing process that consistently produces reliable devices combined with the quantitative assurances he can provide to his customers proving the reliability of his devices. Over the past two decades, laser diode reliability testing techniques and equipment have evolved to support the diverse development of laser diodes.
  • Keywords
    manufacturing processes; optical testing; reliability; semiconductor lasers; manufacturing process; reliability; reliable devices; semiconductor laser diodes; Diode lasers; Hazards; Laser modes; Manufacturing processes; Noise measurement; Optical pulses; Packaging; Semiconductor lasers; Temperature; Testing;
  • fLanguage
    English
  • Journal_Title
    Communications Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0163-6804
  • Type

    jour

  • DOI
    10.1109/MCOM.2006.1593543
  • Filename
    1593543