Title :
Study of turn-on test method for high-voltage thyristor valve
Author :
Kobayashi, S. ; Tanabe, S. ; Itoh, K.
Author_Institution :
Toshiba Corp., Tokyo, Japan
fDate :
1/1/1993 12:00:00 AM
Abstract :
Digital simulations have been conducted to analyze the thyristor valve turn-on phenomenon while a valve arrester is conducting, which gives the most severe turn-on stress for the valve. The effects of various other parameters have also been clarified. Based on this analysis, two test methods are proposed that verify a valve turn-on during arrester conduction, and their effectiveness is described. The nonrepetitive turn-on test given in the IEC Std Pb. 700 and IEEE Std 857 is studied, and a new test voltage level based on these analyses is proposed
Keywords :
digital simulation; power engineering computing; surge protection; testing; thyristor applications; HV thyristor valve; IEC Std Pb. 700; IEEE Std 857; arrester conduction; digital simulations; test voltage level; turn-on test method; Arresters; Delay effects; HVDC transmission; IEC standards; Production facilities; System testing; Thermal stresses; Thyristors; Valves; Voltage;
Journal_Title :
Power Delivery, IEEE Transactions on
