DocumentCode :
826304
Title :
Minimum Ionizing Particle Detection by Secondary Electron Emission
Author :
Faivre, J.C. ; Fanet, H. ; Garin, A. ; Robert, J.P. ; Rouger, M. ; Saudinos, J.
Volume :
24
Issue :
1
fYear :
1977
Firstpage :
299
Lastpage :
301
Abstract :
The use of secondary electron emission to detect high energy particles is investigated. Low density KCl layers have been tested to detect MeV electrons, 400-750 MeV protons and high energy deuterons. The efficiency and the secondary electron spectrum are presented. The results justify the use of low-density KCl layer to detect minimum ionizing particles.
Keywords :
Argon; Availability; Detectors; Electron emission; Energy resolution; Ion accelerators; Kirchhoff´s Law; Particle accelerators; Protons; Testing;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1977.4328693
Filename :
4328693
Link To Document :
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