DocumentCode :
826769
Title :
A High Intensity Source of Polarized X-Rays for Fluorescent Excitation Analysis (FEA)
Author :
Kaufman, Leon ; Shosa, Dale ; Camp, David C.
Author_Institution :
University of California - San Francisco
Volume :
24
Issue :
1
fYear :
1977
Firstpage :
525
Lastpage :
531
Abstract :
FEA is being used in medicine to substitute radiotracers and chemical analysis of stable tracers. Excitation with polarized x-rays reduces tracer working levels: Since they scatter at preferential angles they reduce the number of photons reaching the detector, thus decreasing system dead time and background. The use of a 160KV 19mA x-ray tube for FEA of iodine (and neighboring elements) realizes count-rates of 2.5 cts/sec/ppmI and background reductions from 11.5 ppmI (when using Am-241 excitation) to 5.7 ppmI. These early results indicate that counting time to realize constant quantitation accuracy can be reduced by 90%. Since the use of the x-ray tube results in a 50% increase in the cost of the source-excited automated system, the ten-fold reduction in analysis time makes this a practical approach.
Keywords :
Chemical analysis; Chemical elements; Costs; Electromagnetic scattering; Fluorescence; Particle scattering; Polarization; X-ray detection; X-ray detectors; X-ray scattering;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1977.4328736
Filename :
4328736
Link To Document :
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