• DocumentCode
    826769
  • Title

    A High Intensity Source of Polarized X-Rays for Fluorescent Excitation Analysis (FEA)

  • Author

    Kaufman, Leon ; Shosa, Dale ; Camp, David C.

  • Author_Institution
    University of California - San Francisco
  • Volume
    24
  • Issue
    1
  • fYear
    1977
  • Firstpage
    525
  • Lastpage
    531
  • Abstract
    FEA is being used in medicine to substitute radiotracers and chemical analysis of stable tracers. Excitation with polarized x-rays reduces tracer working levels: Since they scatter at preferential angles they reduce the number of photons reaching the detector, thus decreasing system dead time and background. The use of a 160KV 19mA x-ray tube for FEA of iodine (and neighboring elements) realizes count-rates of 2.5 cts/sec/ppmI and background reductions from 11.5 ppmI (when using Am-241 excitation) to 5.7 ppmI. These early results indicate that counting time to realize constant quantitation accuracy can be reduced by 90%. Since the use of the x-ray tube results in a 50% increase in the cost of the source-excited automated system, the ten-fold reduction in analysis time makes this a practical approach.
  • Keywords
    Chemical analysis; Chemical elements; Costs; Electromagnetic scattering; Fluorescence; Particle scattering; Polarization; X-ray detection; X-ray detectors; X-ray scattering;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1977.4328736
  • Filename
    4328736