Title :
A 0.8-V 128-kb four-way set-associative two-level CMOS cache memory using two-stage wordline/bitline-oriented tag-compare (WLOTC/BLOTC) scheme
Author :
Lin, Perng-Fei ; Kuo, James B.
Author_Institution :
Goyatek Technol. Inc., Hsinchu, Taiwan
fDate :
10/1/2002 12:00:00 AM
Abstract :
This paper reports a 0.8-V 128-kb four-way set-associative two-level CMOS cache memory using a novel two-stage wordline/bitline-oriented tag-compare (WLOTC/BLOTC) and sense wordline/bitline (SWL/SBL) tag-sense amplifiers with an eight-transistor (8-T) tag cell in Level 2 (L2) and a 10-T shrunk logic swing (SLS) memory cell. with the ground/floating (G/F) data sense amplifier in Level 1 (L1) for high-speed operation for low-voltage low-power VLSI system applications. Owing to the reduced loading at the SWL in the new 11-T tag cell using the WLOTC scheme, the 10-T SLS memory cell with G/F sense amplifier in L1, and the split comparison of the index signal in the 8-T tag cells with SWL/SBL tag sense amplifiers in L2, this 0.8-V cache memory implemented in a 1.8-V 0.18-μm CMOS technology has a measured L1/L2 hit time of 11.6/20.5 ns at the average dissipation of 0.77 mW at 50 MHz.
Keywords :
CMOS memory circuits; VLSI; cache storage; content-addressable storage; low-power electronics; memory architecture; 0.18 micron; 0.77 mW; 0.8 V; 1.8 V; 11.6 ns; 128 kbit; 20.5 ns; 50 MHz; cache memory architecture; eight-transistor tag cell; four-way set-associative memory; ground/floating data sense amplifier; high-speed operation; low-power VLSI system applications; low-voltage VLSI system applications; sense wordline/bitline amplifiers; shrunk logic swing memory cell; tag-sense amplifiers; ten-transistor memory cell; two-level CMOS cache memory; wordline/bitline-oriented tag-compare; CMOS logic circuits; CMOS technology; Cache memory; Laser sintering; Low voltage; Operational amplifiers; Power generation; Semiconductor device measurement; Signal generators; Very large scale integration;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2002.803023