Title :
A simple intensity noise reduction technique for optical low-coherence reflectometry
Author :
Sorin, W.V. ; Baney, D.M.
Author_Institution :
Hewlett-Packard Lab., Palo Alto, CA, USA
Abstract :
It is shown that by attenuating the reference power in an optical low-coherence reflectometry (OLCR) measurement, the reflection sensitivity can be improved, even though, in many other types of optical measurements, sensitivity is improved as optical power is increased. The difference is due to the presence of inherent intensity noise associated with low-coherence sources, which can dominate over shot noise at optical powers that are as low as 1 mu W. A reflection sensitivity of -146 dB is demonstrated using this technique.<>
Keywords :
light interferometry; reflectometry; sensitivity; 1 muW; fibre optic sensors; inherent intensity noise; intensity noise reduction technique; light interferometry; light sources; low-coherence sources; optical low-coherence reflectometry; optical measurements; optical power; reference power; reflection sensitivity; shot noise; Acoustic reflection; Noise reduction; Optical attenuators; Optical fiber polarization; Optical interferometry; Optical noise; Optical receivers; Optical reflection; Optical sensors; Reflectometry;
Journal_Title :
Photonics Technology Letters, IEEE
