• DocumentCode
    82805
  • Title

    A Study of Pulsed Activation of Trapped Field Magnets—Part 1: Effects of Pulse Height and Creep

  • Author

    Parks, Daniel ; Weinstein, Roy ; Davey, Kent ; Sawh, Ravi-Persad

  • Author_Institution
    Phys. Dept., Univ. of Houston, Houston, TX, USA
  • Volume
    23
  • Issue
    3
  • fYear
    2013
  • fDate
    Jun-13
  • Firstpage
    6800305
  • Lastpage
    6800305
  • Abstract
    We report experimental results of a study of pulsed field activation of YBCO trapped field magnets (TFMs), at 77 K, in which the applied field covers an area smaller than the TFM. Data on a subset of experiments, in which pulse amplitude is varied, show the effects on trapped field distribution and creep. At low pulse height, trapped field is observed at the sample periphery, even at applied field well below BC1. At increased fields, the measured J is not limited to JC or zero, as in the Bean model, but varies continuously from 0 to JC, possibly as a result of averaging over the spatially varying applied field. For partial activation, creep is a function of r. As the critical state is approached, the spread in creep rates collapses to a single value. Full activation is obtained by a single pulse of applied field approximately 3.3 times maximum trapped field on the TFM surface.
  • Keywords
    Bean model; barium compounds; creep; high-temperature superconductors; superconducting magnets; yttrium compounds; Bean model; TFM surface; YBCO; YBCO trapped field magnets; creep rates; critical state; low pulse height; maximum trapped field; partial activation; pulse height effects; pulsed field activation; sample periphery; spatially varying applied field; temperature 77 K; trapped field distribution; Barium; Bean model; Coils; Creep; Discharges (electric); High temperature superconductors; Iron; Trapped fieldmagnet (TFM) pulsed activation; YBCO trapped field;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2012.2231454
  • Filename
    6373707