• DocumentCode
    828224
  • Title

    A probabilistic nodal loading model and worst case solutions for electric power system voltage stability assessment

  • Author

    Kataoka, Yoshihiko

  • Author_Institution
    R&D Center, Tokyo Electr. Power Co. Inc., Yokohama, Japan
  • Volume
    18
  • Issue
    4
  • fYear
    2003
  • Firstpage
    1507
  • Lastpage
    1514
  • Abstract
    In this paper, a new nodal loading model for use in voltage stability assessment of electric power systems is proposed, and the formulation of worst cases based on this model, as well as related numerical methods, are described. In this nodal loading model, called the "hyper-cone" model, a set of future operating points in a load parameter space is modeled. That is, the "vertex" of the hyper-cone is taken to be the current operating point, and the "thickness" of the hyper-cone represents the uncertainty of future loading. The worst loading case is the point, among the set of transfer limit points on or within the hyper-cone, at which the total load is smallest. In other words, in terms of the uncertainty of future loading, the worst case corresponds to the most conservative transfer limit. Efficient numerical methods to compute this worst case are shown, and these methods are demonstrated on some sample power systems including IEEE 118-node system.
  • Keywords
    load (electric); power system dynamic stability; probability; IEEE 118-node system; conservative transfer limit; electric power system; future loading uncertainty; hyper-cone model; hyper-cone vertex; load parameter space; nodal loading model; numerical methods; probabilistic nodal loading model; transfer limit points; voltage stability assessment; worst case solutions; Computer aided software engineering; Load modeling; Maintenance; Power system analysis computing; Power system modeling; Power system reliability; Power system stability; Stability analysis; Uncertainty; Voltage;
  • fLanguage
    English
  • Journal_Title
    Power Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8950
  • Type

    jour

  • DOI
    10.1109/TPWRS.2003.818691
  • Filename
    1245577