Title :
Telemetry Component Tests in the FN Tandem Terminal
Author :
Bicek, J.J. ; Billquist, P.J. ; Yntema, J.L.
Author_Institution :
Argonne National Laboratory, Argonne, Illinois 60439
fDate :
6/1/1977 12:00:00 AM
Keywords :
Copper; Laser theory; Microprocessors; Protection; Read only memory; Read-write memory; Sparks; Telemetry; Testing; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1977.4328889
