Title :
Probabilistic Evaluation of Solutions in Variability-Driven Optimization
Author :
Davoodi, Azadeh ; Khandelwal, Vishal ; Srivastava, Ankur
Author_Institution :
Dept. of Electr. & Comput. Eng, Maryland Univ., College Park, MD
Abstract :
Very large-scale integration design optimization requires comparison of different solutions to evaluate superiority of one over the other. Typically, a solution is superior if it has a better associated timing and cost. In the presence of fabrication variability, the timing and cost of a solution become random variables with spatial and functional correlations. Therefore, the evaluation of solutions shall be performed probabilistically to determine the probability that a solution has better cost and timing. In this paper, the authors propose/evaluate three methods for fast and accurate computation of this probability: 1) regular Monte Carlo (MC) simulation (as a basis of comparison); 2) joint probability density function (jpdf) approximation using moment matching; and 3) bound-based conditional-MC simulation. They integrated these methods in a variability-driven leakage optimization framework using dual threshold voltages. Their results show that jpdf approximation is efficient; however, it results in suboptimal solutions due to lower accuracy approximating jpdf
Keywords :
Monte Carlo methods; VLSI; circuit CAD; circuit optimisation; delays; leakage currents; probability; Monte Carlo simulation; bound-based conditional-MC simulation; delay optimization; functional correlations; joint probability density function approximation; moment matching; process variations; spatial correlations; variability-driven leakage optimization framework; variation-aware design; very large-scale integration design optimization; Computational modeling; Cost function; Design optimization; Fabrication; Large scale integration; Monte Carlo methods; Performance evaluation; Probability density function; Random variables; Timing; Delay/leakage optimization; process variations; variation-aware design;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2006.882529