DocumentCode :
828376
Title :
Modeling of distributed parasitics in power FETs
Author :
Lee, Sunyoung ; Roblin, Patrick ; Lopez, Osvaldo
Author_Institution :
Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA
Volume :
49
Issue :
10
fYear :
2002
fDate :
10/1/2002 12:00:00 AM
Firstpage :
1799
Lastpage :
1806
Abstract :
A distributed circuit analysis of power FETs accounting for the lateral source parasitic impedance in addition to the lateral drain and gate parasitic impedances is presented. Both a numerical solution and an exact analytic solution are derived. Using the exact analytic solution, approximate equivalent circuits are derived for FETs of short gate width for two common types of boundary conditions. When the gate and drain terminals are located on opposite sides of the distributed FET, the lateral source parasitic impedance can be represented for short gate width FETs by an equivalent circuit with a negative series impedance in series with the source terminal. The practical consequences on parameter extraction for device modeling are discussed. The availability of an exact analytic solution for the distributed FET should also assist with the synthesis of traveling wave FETs.
Keywords :
coupled mode analysis; distributed parameter networks; equivalent circuits; impedance matrix; power MOSFET; semiconductor device models; approximate equivalent circuits; boundary conditions; coupled-mode theory; distributed FET; distributed circuit analysis; distributed parasitics modeling; exact analytic solution; lateral drain parasitic impedance; lateral gate parasitic impedance; lateral source parasitic impedance; lossy substrate; negative series impedance; numerical solution; parameter extraction; power FETs; power LDMOSFET; short gate width FETs; traveling wave FETs; Boundary conditions; Circuit analysis; Equivalent circuits; Immune system; Impedance; Microwave FETs; Microwave transistors; Multiaccess communication; Performance gain; Radio frequency;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2002.803647
Filename :
1036090
Link To Document :
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