DocumentCode
828626
Title
Statistical Timing Analysis With Coupling
Author
Sinha, Debjit ; Zhou, Hai
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Northwestern Univ., Evanston, IL
Volume
25
Issue
12
fYear
2006
Firstpage
2965
Lastpage
2975
Abstract
As technology scales to smaller dimensions, increasing process variations and coupling induced delay variations make timing verification extremely challenging. In this paper, the authors establish a theoretical framework for statistical timing analysis with coupling. They prove the convergence of their proposed iterative approach and discuss implementation issues under the assumption of a Gaussian distribution for the parameters of variation. A statistical timer based on their proposed approach is developed and experimental results are presented for the International Symposium on Circuits and Systems benchmarks. They juxtapose their timer with a single pass, noniterative statistical timer that does not consider the mutual dependence of coupling with timing, and another statistical timer that handles coupling deterministically. Monte Carlo simulations reveal a distinct gain (up to 24%) in accuracy by their approach in comparison to the others mentioned
Keywords
Gaussian distribution; VLSI; delays; integrated circuit modelling; iterative methods; statistical analysis; timing; Gaussian distribution; Monte Carlo simulations; coupling; delay variations; iterative approach; statistical timing analysis; very large scale integration; Coupling circuits; Delay effects; Iterative methods; Mutual coupling; Parasitic capacitance; Switching circuits; Timing; Uncertainty; Very large scale integration; Wires; Coupling; fixpoint computation; statistical timing analysis; variability; very large scale integration (VLSI);
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2006.882482
Filename
4014552
Link To Document