DocumentCode :
828626
Title :
Statistical Timing Analysis With Coupling
Author :
Sinha, Debjit ; Zhou, Hai
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Northwestern Univ., Evanston, IL
Volume :
25
Issue :
12
fYear :
2006
Firstpage :
2965
Lastpage :
2975
Abstract :
As technology scales to smaller dimensions, increasing process variations and coupling induced delay variations make timing verification extremely challenging. In this paper, the authors establish a theoretical framework for statistical timing analysis with coupling. They prove the convergence of their proposed iterative approach and discuss implementation issues under the assumption of a Gaussian distribution for the parameters of variation. A statistical timer based on their proposed approach is developed and experimental results are presented for the International Symposium on Circuits and Systems benchmarks. They juxtapose their timer with a single pass, noniterative statistical timer that does not consider the mutual dependence of coupling with timing, and another statistical timer that handles coupling deterministically. Monte Carlo simulations reveal a distinct gain (up to 24%) in accuracy by their approach in comparison to the others mentioned
Keywords :
Gaussian distribution; VLSI; delays; integrated circuit modelling; iterative methods; statistical analysis; timing; Gaussian distribution; Monte Carlo simulations; coupling; delay variations; iterative approach; statistical timing analysis; very large scale integration; Coupling circuits; Delay effects; Iterative methods; Mutual coupling; Parasitic capacitance; Switching circuits; Timing; Uncertainty; Very large scale integration; Wires; Coupling; fixpoint computation; statistical timing analysis; variability; very large scale integration (VLSI);
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2006.882482
Filename :
4014552
Link To Document :
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