• DocumentCode
    828655
  • Title

    Path-Based Statistical Timing Analysis Handling Arbitrary Delay Correlations: Theory and Implementation

  • Author

    Wang, Wei-Shen ; Orshansky, Michael

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX
  • Volume
    25
  • Issue
    12
  • fYear
    2006
  • Firstpage
    2976
  • Lastpage
    2988
  • Abstract
    An efficient path-based statistical timing analysis algorithm that can handle arbitrary causes of delay correlations is proposed in this paper. The algorithm derives bounds for the cumulative distribution function (cdf) of the circuit delay using a new mathematical formulation based on the theory of stochastic majorization. Structural and interchip correlations between path delays can be taken into account. Because the analytical computation of an exact cdf for a probabilistic timing graph is infeasible, tight upper and lower bounds on the true cumulative distribution are derived. The efficiency and accuracy of the algorithm is demonstrated on a set of ISCAS´85 benchmarks. Across the benchmarks, the error of the 95th-percentile delay is 1.1%-3.3%, and the root-mean-square error of the cumulative probability is 1.7%-4.5%. The run time of the proposed algorithm for the largest benchmark circuit takes less than 4 s
  • Keywords
    delays; integrated circuit modelling; microprocessor chips; probability; statistical analysis; timing; circuit delay; cumulative distribution function; delay correlations; integrated circuit reliability; path-based statistical timing analysis algorithm; probabilistic timing graph; stochastic majorization; Algorithm design and analysis; Circuits; Delay; Distributed computing; Distribution functions; Histograms; Performance analysis; Probability; Stochastic processes; Timing; Integrated circuit reliability; statistical timing analysis; variability;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2006.882585
  • Filename
    4014555