Title : 
Fault management of multicell converters
         
        
            Author : 
Turpin, Christophe ; Baudesson, Philippe ; Richardeau, Frédéric ; Forest, François ; Meynard, Thierry A.
         
        
            Author_Institution : 
Lab. d´´Electrotech. et d´´Electron. Ind., CNRS, Toulouse, France
         
        
        
        
        
            fDate : 
10/1/2002 12:00:00 AM
         
        
        
        
            Abstract : 
Component counts and oversimplified reliability rules may lead to the conclusion that multilevel converters are less safe than two-level converters, just because they use more components. A better approach might be to consider that they use a different arrangement of components and also that the consequence of faults may be very different. This paper is focused on the study of the consequences of faults in hard-switching and soft-switching multicell converters. Solutions to minimize the consequences of major faults are described.
         
        
            Keywords : 
fault location; insulated gate bipolar transistors; power convertors; power system harmonics; switching circuits; fault detection; fault location; fault management; fault tolerance; hard-switching multicell converters; insulated gate bipolar transistors; multicell converters; multilevel systems; oversimplified reliability rules; power electronics; power systems harmonics; soft-switching multicell converters; Circuit faults; Electrical fault detection; Explosions; Insulated gate bipolar transistors; Leg; Switches; Switching circuits; Switching converters; Voltage control; Zero voltage switching;
         
        
        
            Journal_Title : 
Industrial Electronics, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TIE.2002.803196