Energy-storage pulsed-power capacitor technology

Author

Laghari, Javaid R. ; Sarjeant, W. James

Author_Institution

Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA

Volume

7

Issue

1

fYear

1992

fDate

1/1/1992 12:00:00 AM

Firstpage

251

Lastpage

257

Abstract

Fundamentals of dielectric capacitor technology and multifactor stress aging of all classes of insulating media that form elements of this technology are addressed. The goal is the delineation of failure processes in highly stressed compact capacitors. Factors affecting the complex aging processes such as thermal, electromechanical, and partial discharges are discussed. Diagnostic measurement techniques available and those being developed to determine material degradation affecting available life and failure probability of capacitors are presented

Keywords

ageing; capacitor storage; failure analysis; life testing; pulsed power technology; aging processes; compact capacitors; diagnostic measurement; dielectric capacitor; electromechanical breakdown; energy-storage pulsed-power capacitor; failure probability; failure process delineation; life testing; material degradation; multifactor stress aging; partial discharges; thermal breakdown; Capacitors; Ceramics; Dielectric constant; Dielectrics and electrical insulation; Java; Permittivity; Senior members; Stress; Switches; Voltage;

fLanguage

English

Journal_Title

Power Electronics, IEEE Transactions on

Publisher

ieee

ISSN

0885-8993

Type

jour

DOI

10.1109/63.124597

Filename

124597