Title :
A synthetic test method for evaluating the shunt capacitor switching performance of vacuum circuit breakers
Author :
Ohshima, I. ; Yokokura, K. ; Matsuda, M. ; Kanai, Y. ; Sato, K. ; Yanabu, S.
Author_Institution :
Toshiba Corp., Tokyo, Japan
fDate :
10/1/1990 12:00:00 AM
Abstract :
A single-phase synthetic test method for evaluating the shunt capacitor switching performance of circuit breakers is proposed. The most important factor for evaluating the performance of a shunt capacitor switch is restriking, which is mainly influenced by the inrush current and the recovery voltage. A synthetic test circuit comprised of a current source, a voltage source, and the high-frequency current source is designed to evaluate vacuum circuit breakers. Results show that this method is especially suitable for obtaining a restriking probability distribution
Keywords :
capacitors; circuit breakers; switching; testing; vacuum apparatus; current source; inrush current; recovery voltage; restriking; shunt capacitor switching performance; single-phase synthetic test method; vacuum circuit breakers; voltage source; Capacitance; Circuit breakers; Circuit testing; Interrupters; Shunt (electrical); Surges; Switched capacitor circuits; Switches; Switching circuits; Voltage;
Journal_Title :
Power Delivery, IEEE Transactions on
