• DocumentCode
    829401
  • Title

    Utilization of ECR mechanism of electrons heating in multipolar magnetic systems of low-pressure plasma Reactors

  • Author

    Petrin, Andrei B.

  • Author_Institution
    Theor. Dept., Russian Acad. of Sci., Moscow, Russia
  • Volume
    34
  • Issue
    1
  • fYear
    2006
  • Firstpage
    70
  • Lastpage
    79
  • Abstract
    In this paper, the electron-cyclotron resonance (ECR) mechanism of electrons heating by electromagnetic wave in ECR microwave low-pressure plasma reactors is considered. In such reactors, ionization is mainly provided by fast electrons trapped by multipolar magnetic system. A particle simulation is carried out for statistical ensemble of electrons in magnetic systems of different configurations with taking into account previous experimental results. The escape of fast electrons from the magnetic traps to the walls is identified as the major factor behind the loss of electrons in the limit of a collisionless plasma. A comparative evaluation of different multipolar magnetic systems is made. Basic requirements are set out concerning the optimal design of multipolar ECR plasma reactors. Several approaches for providing the efficient ECR heating of electrons are proposed.
  • Keywords
    ionisation; magnetic traps; plasma electromagnetic wave propagation; plasma radiofrequency heating; plasma simulation; plasma sources; plasma-wall interactions; collisionless plasma; electromagnetic wave; electron heating; electron loss; electron-cyclotron resonance; ionization; magnetic traps; microwave low-pressure plasma reactors; multipolar magnetic systems; particle simulation; statistical ensemble; Electromagnetic heating; Electron traps; Inductors; Magnetic confinement; Magnetic resonance; Plasma applications; Plasma confinement; Plasma devices; Plasma simulation; Plasma waves; Electron–cyclotron resonance (ECR); low-pressure plasma reactor; multipolar magnetic system;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2005.863569
  • Filename
    1593849