DocumentCode :
829415
Title :
Guest Editors´ Introduction: DFM Drives Changes in Design Flow
Author :
Zorian, Y. ; Camposano, R. ; Strojwas, A.J. ; Kibarian, J.K. ; Alexanian, A. ; Kelly, Nicholas
Volume :
22
Issue :
3
fYear :
2005
Firstpage :
200
Lastpage :
205
Abstract :
Design for manufacturability (DFM) has thus far been the focus of extensive study in the semiconductor industry. Although deep-submicron processes enable the manufacture of area-efficient, high-performance chips, navigating the nanometer landscape presents enormous manufacturability challenges.
Keywords :
DFM; Design for manufacturability; Chip scale packaging; Circuit testing; Design for manufacture; Design optimization; Libraries; Lithography; Manufacturing processes; Performance analysis; Power system modeling; Process control; DFM; Design for manufacturability;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2005.61
Filename :
1438273
Link To Document :
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