Susceptibility of Personal Computer Systems to Fast Transient Electromagnetic Pulses

Author

Camp, Michael ; Garbe, Heyno

Author_Institution

Produktionstechnisches Zentrum Hannover, Smart Devices Ltd., Garbsen

Volume

48

Issue

4

fYear

2006

Firstpage

829

Lastpage

833

Abstract

In this paper, the susceptibility of personal computer systems (mainboard class vary from 8088 processor based system up to Pentium III system) to fast transient electromagnetic pulses (EMP) with double exponential pulse shapes [EMP, ultra wideband (UWB)] is determined. The influence of computer generation, random access memory (RAM)-values, program states, and pulse shapes, as well as the destruction thresholds of single personal computer (PC)-components [central processing unit (CPU), RAM, basic input/output system (BIOS), mainboard] have been investigated. The major result is that susceptibility increases significantly with each computer generation

Keywords

electromagnetic pulse; microcomputers; EMP; PCU; RAM; central processing unit; computer generation; personal computer systems; random access memory; transients electromagnetic pulses; Central Processing Unit; EMP radiation effects; Electromagnetic transients; Microcomputers; Pulse generation; Pulse shaping methods; Random access memory; Read-write memory; Shape; Ultra wideband technology; Double exponential pulse shape; elctromagnetic pulse (EMP); personal computer (PC); susceptibility; ultra wideband (UWB);

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/TEMC.2006.882844

Filename

4014644