Fast Transformation for DAC Parameters Identification

Modeling of digital-to-analog converters (DACs) and identification of their critical parameters are dealt with. The attention is focused on a well-known static model accounting for linearity and intermodulation errors, which are of major concern for DAC functional characterization as well as troubleshooting. The parameters for this model are currently estimated through linear transformations, the application of which is not practical for high-resolution DACs. Practical relations for assessing the uncertainty on estimated parameters are also not available. The authors introduce a new parameter in the model with the aim of proposing an alternative formulation. Complete identification of the DAC under test can thus be pursued through a new fast transformation, characterized by reduced computational burden and suitable for fully in-place implementation