• DocumentCode
    830126
  • Title

    Design and testing of rapid single flux quantum shift registers with magnetically coupled readout gates

  • Author

    Yuh, P. ; Mukhanov, O.A.

  • Author_Institution
    HYPRES Inc., Elmsford, NY, USA
  • Volume
    2
  • Issue
    4
  • fYear
    1992
  • Firstpage
    214
  • Lastpage
    221
  • Abstract
    Experimental superconducting shift registers consisting of on-chip clock generators, clock regeneration and distribution circuits, shift register elements, and readout circuits are designed using rapid single flux quantum logic/memory (RSFQ) gates. A 7-b shift register has been tested to 12 GHz and a 17-b to 21 GHz using external triggering clocks with relative delay measurements. Testing with internal clocks generated from Josephson oscillations shows a potential high-speed operation of 45 GHz for the 7-b and 30 GHz for the 17-b shift registers. Two types of magnetically coupled readout gates are discussed. The chips are fabricated using a Nb/AlO/sub /x/Nb Josephson-junction process at a critical-current density of 1000 A/cm/sup 2/. The power dissipation per bit is 3 mu W.<>
  • Keywords
    shift registers; superconducting logic circuits; 12 GHz; 21 GHz; 3 muW; Josephson oscillations; Nb-AlO/sub x/-Nb junction; RSFQ gates; clock regeneration circuits; design; high-speed operation; magnetically coupled readout gates; on-chip clock generators; power dissipation; rapid single flux quantum shift registers; superconducting shift registers; testing; Circuit testing; Clocks; Delay; Josephson junctions; Logic design; Magnetic flux; Niobium; Semiconductor device measurement; Shift registers; Superconducting logic circuits;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.182733
  • Filename
    182733