• DocumentCode
    83018
  • Title

    Local Difference Binary for Ultrafast and Distinctive Feature Description

  • Author

    Xin Yang ; Kwang-Ting Cheng

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of California, Santa Barbara, Santa Barbara, CA, USA
  • Volume
    36
  • Issue
    1
  • fYear
    2014
  • fDate
    Jan. 2014
  • Firstpage
    188
  • Lastpage
    194
  • Abstract
    The efficiency and quality of a feature descriptor are critical to the user experience of many computer vision applications. However, the existing descriptors are either too computationally expensive to achieve real-time performance, or not sufficiently distinctive to identify correct matches from a large database with various transformations. In this paper, we propose a highly efficient and distinctive binary descriptor, called local difference binary (LDB). LDB directly computes a binary string for an image patch using simple intensity and gradient difference tests on pairwise grid cells within the patch. A multiple-gridding strategy and a salient bit-selection method are applied to capture the distinct patterns of the patch at different spatial granularities. Experimental results demonstrate that compared to the existing state-of-the-art binary descriptors, primarily designed for speed, LDB has similar construction efficiency, while achieving a greater accuracy and faster speed for mobile object recognition and tracking tasks.
  • Keywords
    computer vision; object recognition; object tracking; LDB; binary descriptor; binary string; computer vision; distinctive feature description; gradient difference tests; image patch; intensity tests; local difference binary; mobile object recognition; multiple-gridding strategy; pairwise grid cells; salient bit-selection method; tracking tasks; ultrafast feature description; Databases; Detectors; Face; Real-time systems; Robustness; Training; Training data; Binary feature descriptor; augmented reality; mobile devices; object recognition; tracking;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2013.150
  • Filename
    6579616