• DocumentCode
    83022
  • Title

    A Comparison of Uncertainty Evaluation Methods for On-Wafer S -Parameter Measurements

  • Author

    Teppati, Valeria ; Ferrero, Alessandro

  • Author_Institution
    Millimeter-Wave Electron. Group, ETH Zurich, Zürich, Switzerland
  • Volume
    63
  • Issue
    4
  • fYear
    2014
  • fDate
    Apr-14
  • Firstpage
    935
  • Lastpage
    942
  • Abstract
    An experimental analysis of on-wafer S-parameter uncertainties is presented. Recently, two different approaches, based either on differential numerical programming or on a fully analytical solution, have been introduced. In order to establish their suitability, a careful comparison is given for on-wafer measurements. Through this comparison, possible limitations and causes of errors are also highlighted. Finally, the uncertainty evaluation of the 16-term error model is presented for the first time.
  • Keywords
    S-parameters; measurement errors; measurement systems; measurement uncertainty; numerical analysis; 16-term error model; numerical programming; on-wafer S-parameter measurement uncertainty; uncertainty evaluation method; Calibration; Measurement uncertainty; Noise; Scattering parameters; Software tools; Standards; Uncertainty; Calibration; measurement techniques; measurement uncertainty; millimeter wave devices; millimeter wave technology;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2013.2287796
  • Filename
    6656861
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=83022