DocumentCode
830314
Title
Fabless or IDM? what the future holds for both
Author
Hackworth, M.L.
Volume
20
Issue
6
fYear
2003
Firstpage
76
Lastpage
85
Keywords
Cable TV; Companies; Educational institutions; Electric resistance; Employee welfare; Foundries; Logic design; Manufacturing industries; Semiconductor device manufacture; Testing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2003.1246166
Filename
1246166
Link To Document