DocumentCode :
830314
Title :
Fabless or IDM? what the future holds for both
Author :
Hackworth, M.L.
Volume :
20
Issue :
6
fYear :
2003
Firstpage :
76
Lastpage :
85
Keywords :
Cable TV; Companies; Educational institutions; Electric resistance; Employee welfare; Foundries; Logic design; Manufacturing industries; Semiconductor device manufacture; Testing;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2003.1246166
Filename :
1246166
Link To Document :
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