• DocumentCode
    830317
  • Title

    A feedback strategy to improve the entropy of a chaos-based random bit generator

  • Author

    Addabbo, Tommaso ; Alioto, Massimo ; Fort, Ada ; Rocchi, Santina ; Vignoli, Valerio

  • Author_Institution
    Dept. of Inf. Eng., Univ. of Siena, Italy
  • Volume
    53
  • Issue
    2
  • fYear
    2006
  • Firstpage
    326
  • Lastpage
    337
  • Abstract
    In this paper, the guidelines to design a true random bit generator (TRBG) circuit with a predefined minimum entropy are discussed. The approach is proposed for a TRBG based on a one-dimensional piecewise-linear chaotic map; it does not require bit throughput reduction, and it is suitable for the development of integrated TRBG circuits. In particular, the proposed design strategy is based on a feedback control procedure that allows to dynamically change the system parameters for the correction of the circuit "nonidealities" (e.g., the circuit offsets). The correction algorithm does not require a direct measurement of the system "nonidealities" or of the effective value of the map parameters, but only a dynamic estimation of these quantities based on the observation of the TRBG output. The design approach is validated by a hardware prototype implemented on a field-programmable analog array. The results of the NIST FIPS 140-2 test suite, the DIEHARD test suite, and the Coron\´s Universal test, applied to the TRBG output sequences before and after a simple post processing without throughput reduction, are reported and discussed.
  • Keywords
    chaos generators; circuit feedback; entropy; field programmable analogue arrays; piecewise linear techniques; random number generation; 1D piecewise-linear chaotic map; Coron Universal test; DIEHARD test suite; NIST FIPS 140-2 test suite; analog circuits; chaos-based random bit generator; correction algorithm; entropy; feedback control procedure; feedback strategy; field-programmable analog array; integrated TRBG circuits; nonlinear circuits; random number generation; true random bit generator circuit; Chaos; Entropy; Feedback circuits; Feedback control; Guidelines; Hardware; Integrated circuit measurements; Piecewise linear techniques; Testing; Throughput; Analog circuits; chaos; design methodology; nonlinear circuits; random number generation;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2005.856670
  • Filename
    1593939