Title :
A feedback strategy to improve the entropy of a chaos-based random bit generator
Author :
Addabbo, Tommaso ; Alioto, Massimo ; Fort, Ada ; Rocchi, Santina ; Vignoli, Valerio
Author_Institution :
Dept. of Inf. Eng., Univ. of Siena, Italy
Abstract :
In this paper, the guidelines to design a true random bit generator (TRBG) circuit with a predefined minimum entropy are discussed. The approach is proposed for a TRBG based on a one-dimensional piecewise-linear chaotic map; it does not require bit throughput reduction, and it is suitable for the development of integrated TRBG circuits. In particular, the proposed design strategy is based on a feedback control procedure that allows to dynamically change the system parameters for the correction of the circuit "nonidealities" (e.g., the circuit offsets). The correction algorithm does not require a direct measurement of the system "nonidealities" or of the effective value of the map parameters, but only a dynamic estimation of these quantities based on the observation of the TRBG output. The design approach is validated by a hardware prototype implemented on a field-programmable analog array. The results of the NIST FIPS 140-2 test suite, the DIEHARD test suite, and the Coron\´s Universal test, applied to the TRBG output sequences before and after a simple post processing without throughput reduction, are reported and discussed.
Keywords :
chaos generators; circuit feedback; entropy; field programmable analogue arrays; piecewise linear techniques; random number generation; 1D piecewise-linear chaotic map; Coron Universal test; DIEHARD test suite; NIST FIPS 140-2 test suite; analog circuits; chaos-based random bit generator; correction algorithm; entropy; feedback control procedure; feedback strategy; field-programmable analog array; integrated TRBG circuits; nonlinear circuits; random number generation; true random bit generator circuit; Chaos; Entropy; Feedback circuits; Feedback control; Guidelines; Hardware; Integrated circuit measurements; Piecewise linear techniques; Testing; Throughput; Analog circuits; chaos; design methodology; nonlinear circuits; random number generation;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2005.856670