Title : 
Continuous-Time Noise Modeling From Sampled Data
         
        
            Author : 
Pintelon, Rik ; Schoukens, Johan ; Guillaume, Patrick
         
        
            Author_Institution : 
Dept. of Fundamental Electr. & Instrum., Vrije Univ., Brussels
         
        
        
        
        
        
        
            Abstract : 
Most stochastic processes in engineering applications have an intrinsic continuous-time (CT) nature, for example, the noise generated by resistors and semiconductor devices. A few methods exist that identify CT noise models from sampled data. In this paper, a new method based on the concept of filtered band-limited white noise is introduced, an in-depth analysis of the basic assumptions made by the different approaches is given, and the pros and cons of each method are discussed. Finally, the new method is illustrated on a real measurement problem, i.e., the operational modal analysis of a bridge
         
        
            Keywords : 
continuous time systems; frequency-domain analysis; modal analysis; sampled data systems; semiconductor device noise; signal processing; stochastic processes; white noise; continuous time; filtered band limited white noise; frequency domain; noise modeling; operational modal analysis; sampled data; stochastic processes; system identification; Bridges; Extraterrestrial measurements; Modal analysis; Noise generators; Resistors; Semiconductor device noise; Semiconductor devices; Stochastic processes; System identification; White noise; Continuous time (CT); frequency domain; noise models; system identification;
         
        
        
            Journal_Title : 
Instrumentation and Measurement, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TIM.2006.884131