• DocumentCode
    831045
  • Title

    2006 International Conference on Microelectronic Test Structures

  • Volume
    14
  • Issue
    3
  • fYear
    2005
  • fDate
    6/1/2005 12:00:00 AM
  • Firstpage
    647
  • Lastpage
    647
  • Abstract
    Provides notice of upcoming conference events of interest to practitioners and researchers.
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2005.851897
  • Filename
    1438437
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=831045