Title :
The Application of Operational Amplifiers to Hardened Systems
Author :
Johnston, Allan H.
Author_Institution :
Boeing Aerospace Company Seattle, Washington 98124
Abstract :
Methods are described for evaluating neutron damage in the types of operational amplifiers that are typically used in modern tactical systems. Critical electrical parameters are discussed, and the internal current sources are identified as important control parameters for hardness assurance. These current sources are more important than internal transistor gain in determining internal operating margins of many linear circuit types. Damage factor variability is compared with digital devices, and potential hardness assurance approaches are discussed.
Keywords :
Circuit testing; Control systems; Costs; Degradation; Linear circuits; Neutrons; Operational amplifiers; Radiation hardening; Semiconductor device manufacture; System testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1977.4329167