DocumentCode :
831154
Title :
Threshold current density in strained layer InxGa1-xAs-GaAs quantum-well heterostructure lasers
Author :
Coleman, James J. ; Beernink, Kevin J. ; Givens, Michael E.
Author_Institution :
Microelectron Lab., Illinois Univ., Urbana, IL, USA
Volume :
28
Issue :
10
fYear :
1992
fDate :
10/1/1992 12:00:00 AM
Firstpage :
1983
Lastpage :
1989
Abstract :
The authors consider the transparency carrier density in ideal and practical strained layer InxGa1-xAs-GaAs quantum-well heterostructure lasers. The transparency carrier density in practical structures is then related to transparency current density using realistic values for spontaneous recombination rates. These parameters are incorporated with representative structural parameters into a nonlinear model for gain in a quantum-well laser, in order to provide a complete model for the laser threshold current density in strained layer InxGa1-xAs-GaAs quantum-well heterostructure lasers. These results are then compared and contrasted with experimental laser results from several laboratories
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; semiconductor lasers; III-V semiconductors; laser threshold current density; spontaneous recombination rates; strained layer InxGa1-xAs-GaAs quantum well heterostructure lasers; structural parameters; transparency carrier density; transparency current density; Charge carrier density; Effective mass; Fiber lasers; Laser modes; Laser theory; Pump lasers; Quantum well lasers; Quantum wells; Threshold current; Waveguide lasers;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.159507
Filename :
159507
Link To Document :
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