Title :
Pulse-modulated interferometer for measuring intensity-induced phase shifts
Author :
Rochford, K.B. ; Zanoni, Raymond ; Stegeman, George I. ; Krug, W. ; Miao, E. ; Beranek, M.W.
Author_Institution :
Opt. Sci. Center, Arizona Univ., Tucson, AZ, USA
fDate :
10/1/1992 12:00:00 AM
Abstract :
Single-polarization interferometric measurements of intensity-induced refractive index changes using an intensity-modulated mode-locked laser are reported. The technique is used to determine the electronic and thermal intensity-dependent index changes in a polydiacetylene waveguide. Monte Carlo analysis shows that a sensitivity of at least 0.02 rad is expected from the configuration
Keywords :
integrated optics; light interferometers; light interferometry; optical waveguides; polymers; refractive index measurement; Monte Carlo analysis; configuration; electronic intensity dependent index changes; intensity-induced phase shifts; intensity-induced refractive index changes; intensity-modulated mode-locked laser; polydiacetylene waveguide; pulse modulated interferometer; single polarization interferometric measurements; thermal intensity-dependent index changes; Optical interferometry; Optical pulses; Optical refraction; Optical waveguides; Phase measurement; Phase shifting interferometry; Polarization; Probes; Pulse measurements; Refractive index;
Journal_Title :
Quantum Electronics, IEEE Journal of
