• DocumentCode
    831241
  • Title

    Time-to-voltage converter for on-chip jitter measurement

  • Author

    Xia, Tian ; Lo, Jien-Chung

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of Vermont, Burlington, VT, USA
  • Volume
    52
  • Issue
    6
  • fYear
    2003
  • Firstpage
    1738
  • Lastpage
    1748
  • Abstract
    In this paper, we present the concept and design of a time-to-voltage converter (TVC), and demonstrate its application to on-chip phase-locked loop (PLL) jitter measurement. The TVC operates in an analog, continuous mode without using a sampling clock. It compares the signal under measurement with a reference signal by charging and discharging a capacitor. First, the low-frequency reference signal charges the capacitor in one cycle. Then, the jitter signal discharges the same capacitor repeatedly until the voltage on the capacitor falls below a threshold. The number of times the jitter signal needs to discharge the capacitor is recorded on a binary counter. We demonstrated that a 160-ps injected jitter is successfully measured by the proposed TVC with a 2-MHz reference signal. We also demonstrated the successful measurement of a 14-ps average PLL jitter, without jitter injection. An 8% measurement error is found in both experiments, using four-bit counters. Finally, we analyze the relations between design parameters and show trade-offs between measurement resolution and measurement time.
  • Keywords
    CMOS analogue integrated circuits; VLSI; convertors; frequency synthesizers; phase locked loops; timing jitter; CMOS VLSI; HSPICE simulations; analog continuous mode; circuit design parameter; design parameters; frequency synthesizer; measurement resolution; measurement time; on-chip jitter measurement; phase-locked loop measurement; reference signal; time-to-voltage converter; Capacitors; Clocks; Counting circuits; Jitter; Measurement errors; Phase locked loops; Phase measurement; Sampling methods; Threshold voltage; Time measurement;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2003.818731
  • Filename
    1246544