Title :
Time-to-voltage converter for on-chip jitter measurement
Author :
Xia, Tian ; Lo, Jien-Chung
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Vermont, Burlington, VT, USA
Abstract :
In this paper, we present the concept and design of a time-to-voltage converter (TVC), and demonstrate its application to on-chip phase-locked loop (PLL) jitter measurement. The TVC operates in an analog, continuous mode without using a sampling clock. It compares the signal under measurement with a reference signal by charging and discharging a capacitor. First, the low-frequency reference signal charges the capacitor in one cycle. Then, the jitter signal discharges the same capacitor repeatedly until the voltage on the capacitor falls below a threshold. The number of times the jitter signal needs to discharge the capacitor is recorded on a binary counter. We demonstrated that a 160-ps injected jitter is successfully measured by the proposed TVC with a 2-MHz reference signal. We also demonstrated the successful measurement of a 14-ps average PLL jitter, without jitter injection. An 8% measurement error is found in both experiments, using four-bit counters. Finally, we analyze the relations between design parameters and show trade-offs between measurement resolution and measurement time.
Keywords :
CMOS analogue integrated circuits; VLSI; convertors; frequency synthesizers; phase locked loops; timing jitter; CMOS VLSI; HSPICE simulations; analog continuous mode; circuit design parameter; design parameters; frequency synthesizer; measurement resolution; measurement time; on-chip jitter measurement; phase-locked loop measurement; reference signal; time-to-voltage converter; Capacitors; Clocks; Counting circuits; Jitter; Measurement errors; Phase locked loops; Phase measurement; Sampling methods; Threshold voltage; Time measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2003.818731