• DocumentCode
    831485
  • Title

    Design and characterization of a fast CMOS multiple linear array imager for nanosecond light pulse detections

  • Author

    Casadei, Bruno ; Le Normand, Jean-Pierre ; Hu, Y. ; Cunin, B.

  • Author_Institution
    Lab. d´´Electronique et de Phys. des Syst.s Instrum.aux, Strasbourg, France
  • Volume
    52
  • Issue
    6
  • fYear
    2003
  • Firstpage
    1892
  • Lastpage
    1897
  • Abstract
    Active pixel sensors (APS) technology offers performance competitive with charge-coupled device technology, and it offers advantages in on-chip functionality, system power reduction, cost, and miniaturization. In this paper, we present the design and characterization of a fast CMOS APS imager for high-speed laser detections, which can replace streak cameras. It produces intensity information as a function of one spatial dimension and time (I=f(x,t)) from a pixel array with two spatial dimensions. The time information is obtained for the first prototype camera by delaying successively the integration phase for each pixel of the same row. The different noise sources of the APS sensors, such as shot noise due to the photo sensor, thermal noise, and flicker noise due to the readout transistors, and the photon shot noise are presented in order to determine the fundamental limits of the image sensor. The first prototype fast MOS imager (FAMOSI) consists of 64×64 active pixels. The simulation and experimental results show that a conversion gain of 6.73±0.25 μ V/e- has been obtained with a noise level of 87±3 e- rms. The power consumption of the chip is 25 mW at 50 frames/s. The time resolution is 0.8 ns for this new concept camera.
  • Keywords
    CMOS image sensors; flicker noise; integrated circuit noise; shot noise; system-on-chip; thermal noise; CMOS imager; active pixel sensors; fast imager; flicker noise; fundamental limits; high-speed laser detections; multiple linear array imager; nanosecond light pulse detections; pixel noise analysis; shot noise; system on chip; thermal noise; time resolution; 1f noise; CMOS image sensors; CMOS technology; Cameras; Image sensors; Optical arrays; Prototypes; Sensor phenomena and characterization; Sensor systems; Thermal sensors;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2003.820500
  • Filename
    1246566