Title :
Confidence intervals for the signal-to-noise ratio when a signal embedded in noise is observed over repeated trials
Author :
Raz, Jonathan ; Turetsky, Bruce ; Fein, George
Author_Institution :
Dev. Neuropsychol. Lab., Veterans Adm. Med. Center, San Francisco, CA, USA
Abstract :
The problem of estimating the signal-to-noise ratio (SNR) when repeated measurements are made of a deterministic signal embedded in random noise is considered. An estimator is described, its asymptotic distribution is derived, and a method for constructing confidence intervals is proposed. The performance of the method is evaluated using simulated evoked potential data, and an application to real evoked potential data is presented.
Keywords :
bioelectric potentials; asymptotic distribution; confidence intervals; deterministic signal; random noise; signal embedded in noise; signal-to-noise ratio; simulated evoked potential data; Analytical models; Biomedical measurements; Brain modeling; Computational modeling; Humans; Noise measurement; Parameter estimation; Signal to noise ratio; Statistical distributions; Yield estimation; Computer Simulation; Evoked Potentials, Auditory; Humans; Models, Statistical; Signal Transduction;
Journal_Title :
Biomedical Engineering, IEEE Transactions on
