DocumentCode
831642
Title
A Comparative Evaluation of Integrated Injection Logic
Author
Raymond, J.P. ; Pease, R.L.
Author_Institution
Mission Research Corporation La Jolla, California 92037
Volume
24
Issue
6
fYear
1977
Firstpage
2327
Lastpage
2335
Abstract
Radiation effects on integrated injection logic arrays are presented in terms of available data on "conventional" structures and new test data on advanced structures. The advanced structures were developed for improved electrical performance, independent of radiation hardness. These results are used as a basis of reviewing the considerations in hardened I2L development as an LSI technology in comparison to other contemporary LSI technologies.
Keywords
Degradation; Failure analysis; Ionization; Large scale integration; Logic arrays; Logic testing; Neutrons; Performance evaluation; Radiation effects; Radiation hardening;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1977.4329216
Filename
4329216
Link To Document