Title :
Radiation Hardened LSI for the 1980´s: CMOS/SOS vs. I2L
Author :
Donovan, R.P. ; Simons, M. ; Burger, R.M.
Author_Institution :
Research Triangle Institute P. O. Box 12194 Research Triangle Park, North Carolina 27709
Keywords :
Aerospace electronics; Availability; CMOS technology; Costs; Hardware; Integrated circuit technology; Laboratories; Large scale integration; Neutrons; Radiation hardening;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1977.4329217
