DocumentCode :
831702
Title :
Polarimetric measurement of nonspecular wave scattering from building surface roughness
Author :
Budiarto, Hary ; Horihata, Kenshi ; Haneda, Katsuyuki ; Takada, Jun-ichi
Author_Institution :
Tokyo Inst. of Technol., Japan
Volume :
2
Issue :
1
fYear :
2003
fDate :
6/25/1905 12:00:00 AM
Firstpage :
242
Lastpage :
245
Abstract :
The paper presents polarimetric measurements of nonspecular scattering from rough building surfaces. Both V-V and V-H polarizations were estimated independently. The superresolution method was applied as an approach to handle the signal parameters of individual incoming waves scattered from rough building surfaces. In order to comprehend the details of microscopic scattering mechanisms, signal parameters are incorporated into the geometrical ray tracing.
Keywords :
electromagnetic wave polarisation; electromagnetic wave scattering; microwave propagation; multipath channels; parameter estimation; polarimetry; ray tracing; rough surfaces; surface roughness; 4.85 to 5.05 GHz; ESPRIT; geometrical ray tracing; microscopic scattering mechanisms; multipath propagation; nonspecular wave scattering; polarimetric measurement; radio propagation properties; rough building surfaces; signal parameters; superresolution method; vertical-horizontal polarization; vertical-vertical polarization; Antenna measurements; Electromagnetic scattering; Polarization; Receiving antennas; Rough surfaces; Signal resolution; Surface roughness; Surface waves; Transmitters; Transmitting antennas;
fLanguage :
English
Journal_Title :
Antennas and Wireless Propagation Letters, IEEE
Publisher :
ieee
ISSN :
1536-1225
Type :
jour
DOI :
10.1109/LAWP.2003.820686
Filename :
1247436
Link To Document :
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