Title :
Extensions of Models for Transistor Failure Probability Due to Neutron Fluence
Author :
Michalowicz, Joseph V. ; Ausman, George A., Jr.
Author_Institution :
Harry Diamond Laboratories Adelphi, Maryland 20783
Abstract :
Models developed in the Hardening Options for Neutron Effects (HONE) program for predicting transistor failure probability are extended to include probability distributions for the initial current gains and to allow non-zero origins for all random variables concerned. Further, these models are generalized to consider two-transistor combinations. Test cases are calculated to compare the failure probability curves generated by these models with previous results.
Keywords :
Bipolar transistors; Circuit optimization; Data models; Monte Carlo methods; Neutrons; Performance analysis; Predictive models; Probability distribution; Random variables; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1977.4329223
