Fault detection and classification in linear integrated circuits: an application of discrimination analysis and hypothesis testing

Author

Epstein, Benjamin R ; Czigler, Martin ; Miller, Steven R.

Author_Institution

David Sarnoff Res. Center, Princeton, NJ, USA

Volume

12

Issue

1

fYear

1993

fDate

1/1/1993 12:00:00 AM

Firstpage

102

Lastpage

113

Abstract

The standard multivariate techniques of hypothesis testing and discrimination analysis have been applied to detect and classify faults in a variety of linear IC designs. These techniques are potentially useful for tracking IC failures during processing or for assessing failure mechanisms of ICs once the circuits are in field use. The results indicate that the statistical methods investigated potentially yield low detection and classification error rates

Keywords

failure analysis; fault location; linear integrated circuits; monolithic integrated circuits; statistical analysis; IC failures; discrimination analysis; error rates; fault classification; fault detection; fault modelling; linear IC designs; linear integrated circuits; multivariate techniques; Analog integrated circuits; Circuit faults; Circuit testing; Electrical fault detection; Error analysis; Failure analysis; Fault detection; Integrated circuit testing; Statistical analysis;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/43.184847

Filename

184847