• DocumentCode
    83214
  • Title

    Quantum Analytical Modeling for Device Parameters and I – V Characteristics of Nanoscale Dual-Materi

  • Author

    Shee, Sharmistha ; Bhattacharyya, Gargee ; Sarkar, Subir Kumar

  • Author_Institution
    Dept. of Electron. & Telecommun. Eng., Jadavpur Univ., Kolkata, India
  • Volume
    61
  • Issue
    8
  • fYear
    2014
  • fDate
    Aug. 2014
  • Firstpage
    2697
  • Lastpage
    2704
  • Abstract
    This paper presents the quantum analytical model, based on the self-consistent solution of 1-D Schrödinger equation and 2-D Poisson´s equation for the ultrascaled dual-material double-gate (DMDG) silicon-on-nothing MOSFET structure. The quantum mechanical effects (QMEs) have been incorporated in our model to derive the analytical current expressions for the first time ever. Extensive calculations have been carried out to analyze the QMEs on such device performance parameters, like electric field, transconductance, drain conductance, and voltage gain. A comparative analysis based on the drain current has been presented in this paper for the classical and for the quantum model. The authenticity of our proposed quantum model for the DMDG structure is verified by the agreement among the results obtained from the analytical model as well as simulations.
  • Keywords
    MOSFET; Poisson equation; Schrodinger equation; elemental semiconductors; nanoelectronics; quantum theory; semiconductor device models; silicon; 1D Schrödinger equation; 2D Poisson equation; DMDG MOSFET structure; I-V characteristics; QMEs; Si; analytical current expressions; device performance parameters; drain conductance; drain current; electric field; nanoscale dual-material double-gate silicon-on-nothing MOSFET; quantum analytical modeling; quantum mechanical effects; transconductance; voltage gain; Analytical models; Electric potential; Logic gates; MOSFET; Mathematical model; Semiconductor device modeling; Silicon; Drain conductance; drain current; dual material double gate (DMDG); quantization effects; silicon-on-nothing (SON); transconductance; voltage gain; voltage gain.;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2014.2332400
  • Filename
    6849951