DocumentCode
83214
Title
Quantum Analytical Modeling for Device Parameters and
–
Characteristics of Nanoscale Dual-Materi
Author
Shee, Sharmistha ; Bhattacharyya, Gargee ; Sarkar, Subir Kumar
Author_Institution
Dept. of Electron. & Telecommun. Eng., Jadavpur Univ., Kolkata, India
Volume
61
Issue
8
fYear
2014
fDate
Aug. 2014
Firstpage
2697
Lastpage
2704
Abstract
This paper presents the quantum analytical model, based on the self-consistent solution of 1-D Schrödinger equation and 2-D Poisson´s equation for the ultrascaled dual-material double-gate (DMDG) silicon-on-nothing MOSFET structure. The quantum mechanical effects (QMEs) have been incorporated in our model to derive the analytical current expressions for the first time ever. Extensive calculations have been carried out to analyze the QMEs on such device performance parameters, like electric field, transconductance, drain conductance, and voltage gain. A comparative analysis based on the drain current has been presented in this paper for the classical and for the quantum model. The authenticity of our proposed quantum model for the DMDG structure is verified by the agreement among the results obtained from the analytical model as well as simulations.
Keywords
MOSFET; Poisson equation; Schrodinger equation; elemental semiconductors; nanoelectronics; quantum theory; semiconductor device models; silicon; 1D Schrödinger equation; 2D Poisson equation; DMDG MOSFET structure; I-V characteristics; QMEs; Si; analytical current expressions; device performance parameters; drain conductance; drain current; electric field; nanoscale dual-material double-gate silicon-on-nothing MOSFET; quantum analytical modeling; quantum mechanical effects; transconductance; voltage gain; Analytical models; Electric potential; Logic gates; MOSFET; Mathematical model; Semiconductor device modeling; Silicon; Drain conductance; drain current; dual material double gate (DMDG); quantization effects; silicon-on-nothing (SON); transconductance; voltage gain; voltage gain.;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2014.2332400
Filename
6849951
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