DocumentCode
83241
Title
Effective Scalable IEEE 1687 Instrumentation Network for Fault Management
Author
Jutman, Artur ; Devadze, Sergei ; Shibin, Konstantin
Author_Institution
Testonica Lab., Tallinn, Estonia
Volume
30
Issue
5
fYear
2013
fDate
Oct. 2013
Firstpage
26
Lastpage
35
Abstract
The infrastructure of IJTAG can be utilized during operation to detect errors and make appropriate fault handling. This article describes an architecture where error latency and automation are important requirements.
Keywords
IEEE standards; failure analysis; system-on-chip; IJTAG infrastructure; SoC-wide homogenous infrastructure; automation; error detection; error latency; fault handling; fault management; scalable IEEE 1687 instrumentation network; third-party IP cores; Circuit faults; Fault detection; Fault tolerant systems; Reliability; Scalability; Embedded Instrumentation; Failure resilience; Fault Management; IEEE 1687; IJTAG;
fLanguage
English
Journal_Title
Design & Test, IEEE
Publisher
ieee
ISSN
2168-2356
Type
jour
DOI
10.1109/MDAT.2013.2278535
Filename
6579638
Link To Document