Title :
Capacitance characterization method for thick-conductor multiple planar ring structures on multiple substrate layers
Author :
Tefiku, Faton ; Yamashita, Eikichi
Author_Institution :
Dept. of Electr. Eng., Univ. of Electro-Commun., Tokyo, Japan
fDate :
10/1/1992 12:00:00 AM
Abstract :
A capacitance characterization method for thick-conductor multiple planar ring structures on multiple substrate layers has been made by extending the rectangular boundary division method. The region to be considered in the analysis is divided into subregions of thick-wall cylindrical tubes in each of which Laplace´s equation is solved by the method of the separation of variables. A special application scheme of the boundary conditions is devised to decrease the number of necessary equations. Numerical results are shown for circular disk and planar ring structures in comparison with other available data
Keywords :
boundary-value problems; capacitance; microwave integrated circuits; Laplace´s equation; boundary conditions; capacitance characterization method; circular disk; multiple substrate layers; rectangular boundary division method; separation of variables; thick-conductor multiple planar ring structures; Boundary conditions; Capacitance; Conductors; Coupling circuits; Dielectric substrates; Helium; Laplace equations; Microstrip; Microwave integrated circuits; Moment methods;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
