Title :
Experimental determination of parasitic optical feedback by diode laser linewidth measurements
Author :
Kappel, J. ; Heinlein, W.
Author_Institution :
Kaiserslautern Univ., West Germany
fDate :
3/30/1989 12:00:00 AM
Abstract :
Proposes a novel method for the characterisation of parasitic optical feedback by measuring the diode laser linewidth change with injection current. Results were obtained with a MCRW (metal-clad ridge-waveguide) laser and reflections from an optical isolator. A feedback signal 67 dB below the laser output was definitely measured.
Keywords :
feedback; semiconductor junction lasers; spectral line breadth; MCRW; characterisation; diode laser linewidth change; diode laser linewidth measurements; feedback signal; injection current; metal-clad ridge-waveguide; optical isolator; parasitic optical feedback; reflections;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19890307
