DocumentCode :
833196
Title :
Strained-layer multiple-quantum-well InGaAs/GaAs waveguide modulators operating around 1 mu m
Author :
Humbach, O. ; Stohr, A. ; Auer, U. ; Larkins, E.C. ; Ralston, J.D. ; Jäger, D.
Author_Institution :
Fachgebiet Optoelektronik, Duisburg Univ., Germany
Volume :
5
Issue :
1
fYear :
1993
Firstpage :
49
Lastpage :
52
Abstract :
Detailed experimental results on the properties of multiple-quantum-well waveguide modulators on strained InGaAs/GaAs layers are presented. Transmission and photocurrent measurements are performed using a tunable Ti-sapphire-laser. The spectra reveal an absorption edge shift as large as 60 nm at 5 V reverse bias. Optimum performance is achieved around a wavelength of 1 mu m, where an extinction ratio of up to 20 dB is obtained with an absorption loss of less than 2 dB/cm. The overall insertion loss of the modulator approaches a constant value of 6.5 dB at higher wavelengths ( lambda >or=980 nm) which is shown to be mainly affected by coupling losses.<>
Keywords :
III-V semiconductors; electro-optical devices; gallium arsenide; indium compounds; integrated optics; light transmission; optical losses; optical modulation; optical waveguides; photoconductivity; semiconductor quantum wells; 1 micron; 2 dB; 5 V; 6.5 dB; 980 nm; Al/sub 2/O/sub 3/:Ti; III-V semiconductor; InGaAs-GaAs; absorption edge shift; absorption loss; coupling losses; electrooptic characteristics; extinction ratio; insertion loss; multiple-quantum-well InGaAs/GaAs waveguide modulators; photocurrent measurements; reverse bias; strained InGaAs/GaAs layers; transmission measurements; tunable Ti-sapphire-laser; Absorption; Extinction ratio; Gallium arsenide; Indium gallium arsenide; Insertion loss; Performance evaluation; Performance loss; Photoconductivity; Quantum well devices; Wavelength measurement;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/68.185057
Filename :
185057
Link To Document :
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