• DocumentCode
    833704
  • Title

    Zener diode - a protecting device against voltage transients

  • Author

    Acosta, Orlando N.

  • Author_Institution
    Space Support Division, Sperry Rand Corporation
  • Issue
    4
  • fYear
    1969
  • fDate
    7/1/1969 12:00:00 AM
  • Firstpage
    481
  • Lastpage
    488
  • Abstract
    This paper begins with a discussion of the different modes of operation of a zener diode and continues with a study of its behavior during voltage transient conditions. A critique of the accepted electrical analogies of the thermal circuit of a zener diode is conducted, and the analysis of the thermal response of a zener diode to a power pulse is made in a highly simplified thermal model. A brief review of basic semiconductor knowledge is included as a frame of reference for the discussion of the causes of zener diode failure. The concept of zener diode failure produced by a high rate of rise of the junction temperature is introduced.
  • Keywords
    Breakdown voltage; Circuit testing; Electric variables; Protection; Semiconductor diodes; Thermal conductivity; Thermal resistance;
  • fLanguage
    English
  • Journal_Title
    Industry and General Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-943X
  • Type

    jour

  • DOI
    10.1109/TIGA.1969.4181059
  • Filename
    4181059