Title :
A thermomechanical model for adhesion reduction of MEMS cantilevers
Author :
Rogers, James W. ; Mackin, Thomas J. ; Phinney, Leslie M.
Author_Institution :
Dept. of Mech. & Ind. Eng., Illinois Univ., Urbana, IL, USA
fDate :
10/1/2002 12:00:00 AM
Abstract :
Presents a thermomechanical model that describes adhesion reduction in MEMS structures using laser heating. A fracture mechanics model is developed where the interface between the stiction-failed microcantilever and the substrate is treated as a crack, and the energy release rate is calculated using elastic theory. In order to include the effect of a temperature difference between the microcantilever and the substrate, an associated thermal strain energy is included in the fracture model. If the free length is longer than the critical buckling length, the beam buckles decreasing the strain energy of the system. For surface-micromachined polycrystalline silicon cantilevers with an initial crack length of 400 μm, the model predicts that a temperature difference of 100 K repairs microcantilevers as long as 1300 μm. The peeling of adhered beams from the substrate after laser irradiation is experimentally shown with measured crack lengths within 15% of predicted values indicating that the proposed model establishes the mechanism of adhesion reduction by laser irradiation.
Keywords :
adhesion; elemental semiconductors; fracture mechanics; laser materials processing; micromachining; micromechanical devices; semiconductor device models; silicon; 1300 micron; 400 micron; MEMS cantilevers; Si; adhered beams; adhesion reduction; critical buckling length; elastic theory; fracture mechanics model; laser heating; stiction-failed microcantilever; surface-micromachined polysilicon cantilevers; temperature difference; thermal strain energy; thermomechanical model; Adhesives; Capacitive sensors; Heating; Laser beams; Laser modes; Laser theory; Micromechanical devices; Predictive models; Temperature; Thermomechanical processes;
Journal_Title :
Microelectromechanical Systems, Journal of
DOI :
10.1109/JMEMS.2002.803412