Title :
An innovative semianalytical technique for ceramic evaluation at microwave frequencies
Author :
Fathy, Aly E. ; Pendrick, Valerie A. ; Geller, Bernard D. ; Perlow, Stewart M. ; Tormey, Ellen S. ; Prabhu, A. ; Tani, Sadahiro
Author_Institution :
Sarnoff Corp., Princeton, NJ, USA
fDate :
10/1/2002 12:00:00 AM
Abstract :
We have developed an innovative semianalytical technique for various substrate material characterization. The developed technique is a measurement procedure and data-reduction formulation that takes into consideration the radiation loss in a resonant structure, allowing for a more effective means of dielectric- and conductor-loss determination for a microstrip ring resonator and its substrate material. We separate dielectric and conductor loss precisely, evaluate the contribution of each term in the overall loss performance, and analytically predict the error in their respective predicted value.
Keywords :
ceramics; data reduction; dielectric loss measurement; dielectric losses; measurement errors; metallisation; microstrip resonators; microwave measurement; permittivity measurement; substrates; LTCC; Q measurements; ceramic evaluation; conductor loss determination; data reduction formulation; dielectric constant; dielectric loss determination; dielectric permittivity; loss tangent; measurement procedure; measurements errors; metallization conductivity; microstrip ring resonator; microwave frequencies; radiation loss; resonant structure; semianalytical technique; substrate material characterization; Ceramics; Conducting materials; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Dielectric substrates; Loss measurement; Microwave frequencies; Resonance;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2002.803438
