• DocumentCode
    833947
  • Title

    Proximity effect in NiCu-based Josephson tunnel junctions

  • Author

    Latempa, R. ; Parlato, L. ; Peluso, G. ; Pepe, G.P. ; Ruotolo, A. ; Barone, A. ; Golubov, A.A.

  • Author_Institution
    Univ. of Naples "Federico II", Italy
  • Volume
    15
  • Issue
    2
  • fYear
    2005
  • fDate
    6/1/2005 12:00:00 AM
  • Firstpage
    133
  • Lastpage
    136
  • Abstract
    We present experimental results concerning both the fabrication and the characterization of superconducting tunnel junctions based on Nb/NiCu superconductor/ferromagnet (S/F) bilayers. Josephson junctions have been characterized down to T=1.4 K in terms of current-voltage I-V characteristics, Josephson critical current vs magnetic field, role of external magnetic field. Proximity parameters of the bilayer, such as the coherence length and the exchange field energy of the F metal, have been estimated by means of a numerical deconvolution of the I-V data the electronic density of states on both sides of the S/F bilayer. Results have been compared with theoretical predictions from a proximity model for S/F bilayers in the dirty limit in the framework of Usadel equations for the S and F layer, respectively.
  • Keywords
    Josephson effect; copper alloys; critical current density (superconductivity); electronic density of states; nickel alloys; niobium alloys; proximity effect (superconductivity); sputtered coatings; superconducting junction devices; superconducting thin films; I-V characteristics; Josephson critical current; Josephson tunnel junctions; Nb-NiCu; Usadel equations; bilayer proximity parameters; coherence length; electronic density of states; exchange field energy; magnetic field; numerical deconvolution; proximity effect; superconductor/ferromagnet bilayers; Coherence; Critical current; Deconvolution; Fabrication; Josephson junctions; Magnetic fields; Niobium; Predictive models; Proximity effect; State estimation; Proximity effects in superconductor/ferromagnet structures; superconducting devices; tunneling phenomena and Josephson effects;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2005.849713
  • Filename
    1439594